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Non Destructive Testing Amorphous Silicon A Si

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non destructive testing amorphous silicon a si

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139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing

China 139 Micron Amorphous Silicon A-Si Curved A-Si DR Non Destructive Testing on sale
...Amorphous Silicon A-Si Curved A-Si DR And Non-Destructive Testing H3543HWF-AG It is a portable wireless flat detector based on amorphous silicon surface sensor, suitable for pipeline inspection, industrial inspection, non-destructive testing and other fields Sensor Receptor Type a-Si......
HUATEC GROUP CORPORATION

Address: 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096

H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel

China H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel on sale
H3543HWF-AG 139μm Amorphous Silicon A-Si Curved DR Panel Sensor Receptor Type a-Si Scintillator Gos Active Area 350 x 430 mm Resolution 2560 x 3072 Pixel Pitch 139 μm Electricals and interface A/D Conversion 16 bits Data Interface Gigabit Ethernet/802.11ac......
HUATEC GROUP CORPORATION

Address: 7th Floor, Chengyuan Building B, the Mid. Road of Jiancaicheng Haidian Dist.BeiJing,CHINA 100096

UNC Series NDT X-Ray Equipment DR with Amorphous Silicon Detector and 2600*2784*2440mm Footprint

China UNC Series NDT X-Ray Equipment DR with Amorphous Silicon Detector and 2600*2784*2440mm Footprint on sale
UNC Series NDT X-Ray Equipment (DR) Product Description: Mainly used in metal castings, hardware products, plastic products, refractory materials, resin materials, composite materials, ceramic body and welding metal parts and other small products for non-......
Unicomp Technology

Address: Building A, Bangkai Science & Technology Industrial Park, No. 9 Bangkai Road, Hi-Tech Industrial Park, Guangming District, Shenzhen

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