AtomEdge Pro: Multi-Functional Atomic Force Microscope – 3D Imaging For Materials

Product Description:

The Atomic Force Microscope (AFM) is a cutting-edge instrument designed for high-precision surface analysis and characterization at the nanometer scale. This multifunctional measurement tool integrates several advanced microscopy techniques, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve measurements. These capabilities make it an indispensable instrument for researchers and engineers working in fields such as semiconductors, materials science, and nanotechnology, where understanding surface properties at the nanometer resolution is critical.

One of the standout features of this AFM is its exceptionally low noise level in the Z direction, measured at just 0.04 nm. This ultra-low noise floor ensures highly accurate and reliable topographical data, enabling detailed surface profiling even on the most delicate samples. Such precision is vital for applications requiring nanometer resolution, especially when analyzing the intricate surface structures of semiconductor devices and other nanoscale materials.

The instrument offers a versatile scanning rate range from 0.1 Hz to 30 Hz, allowing users to balance between scanning speed and image quality based on their specific experimental needs. This flexibility makes it suitable for a wide variety of applications, from slow, high-resolution imaging to faster scans that capture dynamic processes in real time. Coupled with its maximum image sampling point of 4096*4096, the AFM provides ultra-high-resolution images that reveal minute surface details with exceptional clarity.

In terms of working modes, this Atomic Force Microscope supports multiple operational techniques to accommodate various sample types and measurement objectives. These include Contact Mode, Tap Mode, Phase Imaging Mode, Lift Mode, and Multi-directional Scanning Mode. Contact Mode is ideal for robust surface topography mapping, while Tap Mode minimizes sample damage by intermittently contacting the surface. Phase Imaging Mode helps in distinguishing material properties based on mechanical behavior, and Lift Mode is specialized for measuring long-range forces such as magnetic or electrostatic interactions. Multi-directional Scanning Mode enhances image quality and data accuracy by reducing directional artifacts, making this AFM a flexible and comprehensive solution for nanoscale surface analysis.

The integration of specialized microscopy techniques such as EFM, KPFM, PFM, and MFM extends the instrument’s capabilities beyond simple topographical imaging. EFM allows for the mapping of electrical charge distributions on the sample surface, which is crucial for semiconductor research and development. KPFM measures surface potential variations with high sensitivity, providing insights into electronic properties at the nanoscale. PFM is utilized for studying piezoelectric materials by detecting mechanical responses to electric fields, while MFM is specialized for imaging magnetic domains and structures. These multifunctional measurement capabilities transform this AFM into a powerful Scanning Probe Microscopy (SPM) platform, capable of delivering comprehensive surface characterization in one instrument.

Overall, the Atomic Force Microscope is an essential tool for scientists and engineers working with semiconductors and other nanomaterials. Its combination of multifunctional measurement modes, ultra-low noise performance, flexible scanning rates, and ultra-high-resolution imaging makes it ideally suited for research and industrial applications requiring nanometer resolution. Whether investigating electronic properties, magnetic domains, or mechanical characteristics, this AFM delivers precise and reliable data, advancing the frontiers of nanoscale science and technology.

Features:

• Product Name: Atomic Force Microscope
• Noise Level in the Z Direction: 0.04 Nm
• Scanning Method: XYZ Three-axis Full Sample Scanning
• Sample Size: 25 Mm
• Scanning Rate: 0.1-30 Hz
• Scanning Range: 100 μm * 100 μm * 10 μm
• Supports Nanoscale electrical measurement with high precision
• Provides Nanometer Resolution for detailed surface analysis
• Enables advanced Nanoscale electrical measurement capabilities

Technical Parameters:

Applications:

The Truth Instruments AtomEdge Pro Atomic Force Microscope, proudly made in China, is an advanced and versatile tool designed for a wide range of scientific and industrial applications. Its multifunctional measurement capabilities, including Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (KPFM), Piezoelectric Force Microscopy (PFM), Magnetic Force Microscopy (MFM), and Force Curve analysis, make it an indispensable instrument for researchers and engineers working at the nanoscale.

One of the primary application occasions for the AtomEdge Pro is in topography imaging, where its impressive maximum image sampling resolution of 4096*4096 pixels enables highly detailed surface mapping. This allows for precise visualization of sample surfaces with atomic resolution, which is critical for materials science, semiconductor research, and nanotechnology development. The microscope’s XYZ three-axis full sample scanning method ensures comprehensive scanning of samples up to 25 mm in size, facilitating extensive nanoscale analysis across various sample types and sizes.

In academic research laboratories, the AtomEdge Pro is ideal for studying the physical and chemical properties of nanomaterials. Its low nonlinearity (0.15% in the XY direction and 1% in the Z direction) guarantees accurate and reliable measurements, essential for experiments requiring atomic resolution and high precision. Researchers can utilize the multifunctional modes to investigate electrical, magnetic, and piezoelectric properties of materials, enabling breakthroughs in fields such as energy storage, catalysis, and nanoelectronics.

In industrial settings, the AtomEdge Pro supports quality control and failure analysis in semiconductor manufacturing and microelectronics. The ability to perform nanoscale analysis on complex surfaces helps engineers identify defects and optimize fabrication processes. Furthermore, its compact design and robust performance make it suitable for integration into research and development environments where space and reliability are critical.

Overall, the Truth Instruments AtomEdge Pro Atomic Force Microscope offers unparalleled capabilities for topography imaging and nanoscale analysis with atomic resolution. Its multifunctional measurement features and high precision scanning make it an essential instrument across diverse scientific disciplines and industrial applications, driving innovation and discovery at the atomic level.

Support and Services:

Our Atomic Force Microscope (AFM) product is supported by a dedicated technical support team committed to ensuring optimal performance and user satisfaction. We provide comprehensive assistance including installation guidance, operational training, routine maintenance advice, and troubleshooting support.

Users can access detailed product manuals, application notes, and software updates through our online resources. Our experts are available to help with calibration procedures, imaging techniques, and data analysis to maximize the capabilities of the AFM system.

Regular maintenance services are recommended to maintain the precision and longevity of the microscope. We offer calibration checks, component replacements, and system upgrades performed by certified technicians.

For specialized requirements, custom solutions and consultancy services are available to tailor the AFM system to specific research or industrial applications.

We strive to provide timely and effective support to minimize downtime and enhance the productivity of your Atomic Force Microscope.

FAQ:

Q1: What is the brand and model of this Atomic Force Microscope?

A1: The Atomic Force Microscope is from the brand Truth Instruments, and the model number is AtomEdge Pro.

Q2: Where is the AtomEdge Pro manufactured?

A2: The AtomEdge Pro is manufactured in China.

Q3: What are the primary applications of the AtomEdge Pro Atomic Force Microscope?

A3: The AtomEdge Pro is used for high-resolution surface imaging and measurement at the nanoscale, suitable for materials science, biology, and semiconductor research.

Q4: What type of samples can be analyzed using the AtomEdge Pro?

A4: The AtomEdge Pro can analyze a variety of samples including hard materials, soft biological specimens, thin films, and nanostructures.

Q5: Does the AtomEdge Pro support different scanning modes?

A5: Yes, the AtomEdge Pro supports multiple scanning modes such as contact mode, tapping mode, and non-contact mode to accommodate different sample types and measurement needs.